The researchers examined defect regimes in freestanding monolayer graphene and hBN, ranging from pristine material to high defect concentrations and full amorphization. Defects were introduced using ...

High-resolution Tapping Mode AFM images of graphene nanoribbons on a silicon substrate captured by the upgraded system. Here are two images taken at various sizes: 1) Large-Scale Image: This image ...

Below are two high-resolution Tapping Mode AFM images of graphene nanoribbons on a silicon substrate captured using the upgraded system. The two pictures were taken in different sizes: 1) Large-Scale ...