Wafer probe is another element of the production test, which involves testing the functionality and performance of individual ICs on a wafer before they are separated into individual die and packaged.

Alchip Technologies, Limited, the high-performance ASIC leader, has formally opened its three-dimensional integrated circuit (3DIC) design services for the latest high-performance ASICs targeting AI ...

SAN JOSE, Calif., Wireless System Design Conference and Expo 2002, June 26, 2006 -- Avago Technologies, the world's largest privately held semiconductor company, today announced it is among the first ...