Definition: Scanning Probe Microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM is instrumental in the analysis and ...
A scanning probe microscope comes in a wide variety of flavors, they all produce a set of data points containing the measurements at each location. Usually these data points form a regular 2D grid ...
The Electron and Scanning Probe Microscopy Unit provides solutions for imaging and analysis at the nanoscale. The unit houses two scanning electron microscopes, two scanning probe microscopes and ...
Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...
Scanning Tunneling Microscopy is a subset of Scanning Probe Microscopy (SPM), a group of techniques that image and manipulate surfaces at the nanometer to atomic scales. SPM techniques share the ...
Three powerful options are available with Bruker for performing electrochemical (EC) scanning probe microscopy: Electrochemical Scanning Tunneling Microscopy (ECSTM), Electrochemical Atomic Force ...
The proprietary closed-loop scan delivers noise-levels that approach those of high-end, open-loop systems and offers a wide range of functionality for physical, materials, and life sciences, from ...
Atomic force microscopy is a subset of scanning probe microscopy. The Veeco Dimension 3000 operates in both tapping and contact modes, with capabilities of topographic and phase imaging, lateral force ...