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成都市楠菲微电子申请新专利,AI技术提升芯片小目标缺陷检测效率
2025年1月31日,成都市楠菲微电子有限公司向国家知识产权局申请了一项名为“基于YOLOv5与Swin Transformer融合改进的芯片小目标缺陷检测方法及系统”的专利。作为一家成立于2022年的新兴技术公司,楠菲微电子专注于软件和信息技术服务,致力于为芯片制造提供高效的缺陷检测解决方案。
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