What is Focused Ion Beam Milling? Focused ion beam (FIB) milling is a nanofabrication technique that uses a focused beam of ions to precisely mill, etch, or deposit materials at the nanoscale. It ...
Complementing these, the introduction of focused ion beam-secondary ion mass spectrometry (FIB-SIMS) adds a critical capability to the characterization toolkit, enabling highly sensitive and localized ...
The precision and speed of intelligent FIB scanning strategies for material removal can benefit users. Batches of samples, like TEM lamellae, cross-sections, or any user-defined pattern can be ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Thermo Scientific Auto Slice and View ...
Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Request A Quote Download PDF Copy Request A Quote Download ...